X-ray Photoelectron Spectroscopy Reference Pages – Paperback

X-ray photoelectron spectroscopy (XPS) is a widely established surface analysis technique, capable of providing elemental composition and chemical-state information from the outermost 5-10 nm of a solid surface.

Drawing on decades of practical experience at Surface Science Western, where the author performed XPS analyses on a large variety of samples, the book updates material from the popular website www.xpsfitting.com, providing extra datasets and tabulated items, and a wide range of additional spectra from both published works and well-characterized standard samples.

This comprehensive reference includes

– Binding energy tables compiled from literature sources
– Modified Auger parameter values
– Extensive references to key publications
– Data from well-characterized standard materials
– Curve-fitting procedures and best practices
– Proven analysis methodologies
– Practical tips for accurate XPS interpretation
Featuring more than 450 spectra, including both survey and high-resolution scans from published studies and standard reference samples, this resource provides a rich collection of real-world XPS data and insights.

Whether you are a researcher, analyst, student, or materials scientist, this book places a wealth of essential XPS information at your fingertips, making it an indispensable addition to any surface analysis laboratory or technical library.